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Title Advanced Noise Generator Method of Flicker Noise Measurement
Authors Reschikoff, S.E.
ORCID
Keywords белый шум
білий шум
white noise
полупроводниковые приборы
напівпровідникові прилади
semiconductor devices
Type Conference Papers
Date of Issue 2015
URI http://essuir.sumdu.edu.ua/handle/123456789/40983
Publisher Sumy State University
License
Citation Reschikoff, S.E. Advanced Noise Generator Method of Flicker Noise Measurement [Текст] / S.E. Reschikoff; supervisor V.A. Sergeev // Фізика, електроніка, електротехніка: матеріали та програма науково-технічної конференції, м. Суми, 20-25 квітня 2015 р. / Відп. за вип. С.І. Проценко. — Суми: СумДУ, 2015. — С. 143.
Abstract Noise of electronic devices can be measured by comparison using a noise source at input and an output noise meter. It is noise generator method. It can be used to easily obtaining equivalent input noise of semiconductor devices. But this method is usually recommended for higher frequencies, because measurement generator must give white noise. Besides this, we obtain only noise level at broad band.
Appears in Collections: Наукові видання (ЕлІТ)

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