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Title Influence of deposition conditions on morphological, structural, optical and electro-physical properties of ZnSe films obtained by close-spaced vacuum sublimation
Authors Ivashchenko, Maksym Mykolaiovych
Bibyk, Vitalii Volodymyrovych
Opanasiuk, Anatolii Serhiiovych  
Хіонсік, Чіонг
Хионсик, Чионг
Hyeonsik, Cheong
Дахун, Нам
Дахун, Нам
Dahyun, Nam
Бурик, Іван Петрович
Бурык, Иван Петрович
Buryk, Ivan Petrovuch
Вазієв, Ярослав Георгійович
Вазиев, Ярослав Георгиевич
Vaziev, Jaroslav Georhiyovuch
Keywords ZnSe
морфологія поверхні
морфология поверхности
surface morphology
структура
structure
оптичні властивості
оптические свойства
optical properties
Type Article
Date of Issue 2015
URI http://essuir.sumdu.edu.ua/handle/123456789/42928
Publisher Elsevier
License
Citation Ivashchenko, M. M., Buryk, I. P., Opanasyuk, A. S., Nam, D., Cheong, H., Vaziev, J. G., & Bibyk, V. V. (2015). Influence of deposition conditions on morphological, structural, optical and electro-physical properties of ZnSe films obtained by close-spaced vacuum sublimation. Materials Science in Semiconductor Processing, 36, 13-19. ISO 690
Abstract ZnSe thin films were deposited on well-cleaned glass substrates by the close-spaced vacuum sublimation technique. Various structural, sub-structural and optical properties have been investigated through scanning electron microscopy (SEM), X-ray diffraction (XRD), spectral photometry, Raman spectroscopy and Fourier transform infrared (FTIR) spectroscopy. Electro-physical studies were performed using an ITO/ZnSe/In “sandwich” structure.The correlation between the films structure and their optical and electro- physical properties was estimated. The evaluated films were fine-crystalline, with their grain size depending on the substrate temperature. The optical band gap was estimated through optical measurements and the high optical qualities of the ZnSe films were confirmed by Raman and FTIR analyses.
Appears in Collections: Наукові видання (ЕлІТ)

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