Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/43119
Title: Morphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation
Authors: Ivashchenko, Maksym Mykolaiovych
Opanasiuk, Anatolii Serhiiovych 
Perekrestov, Viacheslav Ivanovych
Kosiak, Volodymyr Volodymyrovych
Hnatenko, Yurii Pavlovych 
Коломієць, Володимир Миколайович
Коломиец, Владимир Николаевич
Kolomiets, Volodumur Mykolayovuch
Keywords: тонкі плівки
тонкие пленки
Thin films
RBS
CdSe
рентгеноструктурний аналіз
рентгеноструктурный анализ
X-ray diffraction analysis
морфологія поверхні
морфология поверхности
Surface morphology
Issue Year: 2015
Publisher: Vacuum
Citation: Morphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation [Текст] / M.M. Ivashchenko, A.S. Opanasyuk, V.I. Perekrestov, V.V. Kosyak and al // Vacuum. - 2015 . - Vol.119. - P.81-87.
Abstract: The polycrystalline CdSe films were deposited by the close-spaced vacuum sublimation technique at the different substrate temperatures (373e873 K). Surface morphology, grain size and growth mechanism of the films were determined by the scanning electron microscopy. The X-ray diffraction analysis of structural and sub-structural properties of the films was carried out to study their phase composition and growth texture. The main structural parameters of thin films, such as texture, lattice parameter, grain size, scattering domain size and micro-stress level have been determined in the work depending on the condensation film conditions. RBS and FTIR analysis shows that obtained films in general are homogenous and pure. As a result, the growth conditions of CdSe polycrystalline films with good crystal quality were determined.
URI: http://essuir.sumdu.edu.ua/handle/123456789/43119
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

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