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dc.contributor.authorІващенко, Максим Миколайович-
dc.contributor.authorИващенко, Максим Николаевич-
dc.contributor.authorIvashchenko, Maksym Mykolaiovych-
dc.contributor.authorОпанасюк, Анатолій Сергійович-
dc.contributor.authorОпанасюк, Анатолий Сергеевич-
dc.contributor.authorOpanasiuk, Anatolii Serhiiovych-
dc.contributor.authorПерекрестов, Вячеслав Іванович-
dc.contributor.authorПерекрестов, Вячеслав Иванович-
dc.contributor.authorPerekrestov, Viacheslav Ivanovych-
dc.contributor.authorКосяк, Володимир Володимирович-
dc.contributor.authorКосяк, Владимир Владимирович-
dc.contributor.authorKosiak, Volodymyr Volodymyrovych-
dc.contributor.authorГнатенко, Юрій Павлович-
dc.contributor.authorГнатенко, Юрий Павлович-
dc.contributor.authorHnatenko, Yurii Pavlovych-
dc.contributor.authorКоломієць, Володимир Миколайович-
dc.contributor.authorКоломиец, Владимир Николаевич-
dc.contributor.authorKolomiets, Volodumur Mykolayovuch-
dc.identifier.citationMorphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation [Текст] / M.M. Ivashchenko, A.S. Opanasyuk, V.I. Perekrestov, V.V. Kosyak and al // Vacuum. - 2015 . - Vol.119. - P.81-87.ru_RU
dc.description.abstractThe polycrystalline CdSe films were deposited by the close-spaced vacuum sublimation technique at the different substrate temperatures (373e873 K). Surface morphology, grain size and growth mechanism of the films were determined by the scanning electron microscopy. The X-ray diffraction analysis of structural and sub-structural properties of the films was carried out to study their phase composition and growth texture. The main structural parameters of thin films, such as texture, lattice parameter, grain size, scattering domain size and micro-stress level have been determined in the work depending on the condensation film conditions. RBS and FTIR analysis shows that obtained films in general are homogenous and pure. As a result, the growth conditions of CdSe polycrystalline films with good crystal quality were determined.ru_RU
dc.description.sponsorshipThis research was supported by the Ministry of Education and Science of Ukraine (Grant N 0113U000131).ru_RU
dc.subjectтонкі плівкиru_RU
dc.subjectтонкие пленкиru_RU
dc.subjectThin filmsru_RU
dc.subjectрентгеноструктурний аналізru_RU
dc.subjectрентгеноструктурный анализru_RU
dc.subjectX-ray diffraction analysisru_RU
dc.subjectморфологія поверхніru_RU
dc.subjectморфология поверхностиru_RU
dc.subjectSurface morphologyru_RU
dc.titleMorphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimationru_RU
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