Practical Analysis of the Properties of Nanoscale Electronic Elements Aimed at their Application when Designing Parallel Architecture Computing Systems

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Title	Practical Analysis of the Properties of Nanoscale Electronic Elements Aimed at their Application when Designing Parallel Architecture Computing Systems
Authors	Makarov, M.V.
ORCID
Keywords	nanoscale electronics properties of nanomaterials memristors parallel computing fault tolerance
Type	Article
Date of Issue	2016
URI	http://essuir.sumdu.edu.ua/handle/123456789/47379
Publisher	Sumy State University
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Citation	Makarov, M.V. Practical Analysis of the Properties of Nanoscale Electronic Elements Aimed at their Application when Designing Parallel Architecture Computing Systems [Текст] / M.V. Makarov // Журнал нано- та електронної фізики. - 2016. - Т.8, №3. - 03023
Abstract	This article presents an approach to the practical analysis of nanomaterials which determine the reliability parameters of nanoscale electronic hardware components when they are used in developing faulttolerant high-performance computing systems. We propose a methodology of theoretical and experimental study of the reliability values of the memristor models used as the synaptic connections of an artificial neural network that approximate a differential equation.
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)