Structural and Dielectric Characterization of Sm2MgMnO6

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Title	Structural and Dielectric Characterization of Sm2MgMnO6
Authors	Rudra, M. Maity, R. Sinha, T.P.
ORCID
Keywords	SMMO Rietveld Refinement Dielectric Relaxation Conductivity
Type	Article
Date of Issue	2017
URI	http://essuir.sumdu.edu.ua/handle/123456789/66018
Publisher	Sumy State University
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Citation	Rudra, M. Structural and Dielectric Characterization of Sm2MgMnO6 [Текст] / M. Rudra, R. Maity, T.P. Sinha // Журнал нано- та електронної фізики. - 2017. - Т.9, № 5. - 05009. - DOI: 10.21272/jnep.9(5).05009.
Abstract	The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173 K by means of sol-gel technique. Rietveld refinement of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data.
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)