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Title | Structure Features of Bismuth Films Doped with Tellurium |
Authors |
Matveev, D.Yu.
Starov, D.V. Demidov, E.V. |
ORCID | |
Keywords |
thin films impurity bismuth tellurium growth figure crystallite size |
Type | Article |
Date of Issue | 2018 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/68636 |
Publisher | Sumy State University |
License | |
Citation | Matveev, D.Yu. Structure Features of Bismuth Films Doped with Tellurium [Текст] / D.Yu. Matveev, D.V. Starov, E.V. Demidov // Журнал нано- та електронної фізики. - 2018. - Т. 10, № 2. - 02047. - DOI: 10.21272/jnep.10(2).02047. |
Abstract |
The influence of doping degree on the structural characteristics of bismuth films doped with tellurium
in the concentration range 0.005-0.150 at. % Te and the thickness range 0.3-0.7 µm is studied at present
article. Authors have established that an increase of the doping degree with tellurium in bismuth films
leads to a significant decreasing of the growth figures. The weak influence of annealing on the crystallite
size of bismuth films doped with tellurium indicates their high temporal stability of the structure. |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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