Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/846
Or use following links to share this resource in social networks: Recommend this item
Title Experimental Test of a Three-Dimensional Model for Electrophysical Properties of Metal Films
Authors Chornous, Anatolii Mykolaiovych  
Opanasiuk, Nadiia Mykolaivna
Pohrebniak, Oleksandr Dmytrovych  
Protsenko, Ivan Yukhymovych  
ORCID http://orcid.org/0000-0002-5009-5445
http://orcid.org/0000-0002-9218-6492
http://orcid.org/0000-0003-3351-9303
Keywords thin film
size effects
thermal coefficient of resistance
тонка плівка
розмірні ефекти
температурний коефіцієнт опору
тонкая пленка
размерные эффекты
температурный коэффициент сопротивления
Type Article
Date of Issue 2000
URI http://essuir.sumdu.edu.ua/handle/123456789/846
Publisher The Japan Society of Applied Physics
License
Citation Experimental Test of a Three-Dimensional Model for Electrophysical Properties of Metal Films [Text] / A.M. Chornous, N.M. Opanasyuk, A.D. Pogrebnjak, I.Yu. Protsenko // Jpn. J. Appl. Phys. Vol. 39 (2000) pp. L 1320-L 1323 Part 2, No. 12B.
Abstract A three-dimensional model of strain sensitivity proposed by [Tellier, Tosser: Thin Solid Films 59 (1979) 163; Tosser, Tellier and Pichard: J. Mater. Sci. 16 (1981) 944] has been tested for thin Cr, Cu and Co films. The films were obtained by electron-beam evaporation in a vacuum of 10-4 – 10-5 Pa. Film structure stabilization was carried out by heating and cooling at the rate of 3 K/min in the range of 300 to 520 K. The identity of properties of the films obtained on the glass (during the thermal coefficient of resistance (TCR) measuring) and the textolite glass (during the strain-sensitivity coefficient (SSC) measuring) substrates was examined according to Vand method on lattice distortion energy spectra for films of different thickness, where the spectra were calculated from the resistance-temperature data. It has been shown that the experimental results of the strain sensitivity agree with the calculated ones only under the assumption of size dependence of the electron mean-free path. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/846
Appears in Collections: Наукові видання (ЕлІТ)

Views

Argentina Argentina
1
Australia Australia
-820238602
Brazil Brazil
1
China China
360712012
France France
893789
Germany Germany
48537
Greece Greece
277992028
India India
1
Iran Iran
3
Ireland Ireland
1545224252
Kazakhstan Kazakhstan
2
Lithuania Lithuania
108815213
Netherlands Netherlands
893787
Russia Russia
31
Singapore Singapore
-1480506553
Sweden Sweden
1
Turkey Turkey
17
Ukraine Ukraine
442019213
United Kingdom United Kingdom
173530
United States United States
-1480506555
Unknown Country Unknown Country
57442
Vietnam Vietnam
277992026

Downloads

Canada Canada
1
China China
939818754
Germany Germany
220546
India India
939818754
Iraq Iraq
1
Ireland Ireland
1
Japan Japan
1
Lithuania Lithuania
1
Netherlands Netherlands
1
Russia Russia
1
Spain Spain
1
Ukraine Ukraine
51030161
United Kingdom United Kingdom
10048228
United States United States
-766429822
Unknown Country Unknown Country
-766429823
Vietnam Vietnam
1

Files

File Size Format Downloads
1674.pdf 571.54 kB Adobe PDF 408076807

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.