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Title Electromigration Effects at Epitaxial Growth of Thin Films: Phase-Field Modeling
Authors Dvornychenko, Alina Vasylivna  
ORCID http://orcid.org/0000-0003-4530-4262
Keywords hase-field method
epitaxial growth
surface structures
electromigration
numerical simulation
statistical characteristics
Type Article
Date of Issue 2021
URI https://essuir.sumdu.edu.ua/handle/123456789/84695
Publisher Department of Physics and Astronomy of the National Academy of Sciences of Ukraine
License Creative Commons Attribution 4.0 International License
Citation Dvornichenko, A. (2021). Electromigration Effects at Epitaxial Growth of Thin Films: Phase-Field Modeling. Ukrainian Journal of Physics, 66(5), 439. https://doi.org/10.15407/ujpe66.5.439
Abstract he epitaxial growth of thin films with regard for the anisotropy of the adsorbate surface dif-fusion induced by electromigration effects has been studied theoretically in the framework ofthe phase-field theory and with the use of numerical simulations. The influence of the coef-ficient of electromigration-induced anisotropic diffusion, which is proportional to the appliedelectric field strength, on the dynamics of growth of the film thickness and the height of sur-face structures, growing surface morphology, statistical characteristics of the surface multilayeradsorbate structures, and distribution of surface structures over their heights is revealed.
Appears in Collections: Наукові видання (ЕлІТ)

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