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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2014 | Multiangular and Spectral Ellipsometry for Semiconductor Nanostructures Classification | Goloborodko, A.A.; Epov, M.V; Robur, L.Y; Rodionova, T.V. | Article | 1589120198 | 705340013 |