Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver

Pazukha, Iryna Mykhailivna; Shuliarenko, Denys Olehovych; Pylypenko, Oleksandr Valeriiovych; Ovrutskyi, Maksym Serhiiovych; Odnodvorets, Larysa Valentynivna

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Title	Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver
Authors	Pazukha, Iryna Mykhailivna Shuliarenko, Denys Olehovych Pylypenko, Oleksandr Valeriiovych Ovrutskyi, Maksym Serhiiovych Odnodvorets, Larysa Valentynivna
ORCID	http://orcid.org/0000-0001-9410-3024 http://orcid.org/0000-0002-8112-1933
Keywords	thin-film electrical resistivity temperature coefficient of resistance size effect concentration effect
Type	Article
Date of Issue	2020
URI	https://essuir.sumdu.edu.ua/handle/123456789/82970
Publisher	Vasyl Stefanyk Precarpathian National University
License	Creative Commons Attribution 4.0 International License
Citation	PazukhaI.M., ShuliarenkoD.O., Pylypenko O.V., Оvrutskyi M.S. and Odnodvorets L.V. 2020. Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver. Physics and Chemistry of Solid State. 21, 2 (Jun. 2020), 238-242. DOI:https://doi.org/10.15330/pcss.21.2.238-242.
Abstract	Complex study of electrophysical properties (the electrical resistivity r and the temperature coefficient of resistance (TCR) b) of thin-film samples based on ferromagnetic alloy Ni80Fe20 (permalloy) and noble metal Ag in a wide composition range and within the range of thickness 20-100 nm done. Thin films were obtained by the method of electron-beam co-evaporation technique at room temperature. Their composition was investigated using the method of X-ray spectrometry. The phase state was analyzed by the electron diffraction method. It was demonstrated that the crystal structure of thin films stays unchanged during the annealing process to 500 K. The size and concentration dependences of r and b values were obtained. The corresponding maximum and minimum at the concentration of Ag atoms of 50-60 at.% observed at the dependences r(cAg) and b(cAg). Size dependences r(d) and b(d) associated with the size effects in thin-film materials.
Appears in Collections:	Наукові видання (ЕлІТ)