Періодичні видання СумДУ
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Item Calculation of Intracellular Pressure of Red Blood Cells at Jaundice According to Atomic Force Microscopy Data(Sumy State University, 2016) Nagornov, Yu.S.; Zhilyaev, I.VThe present work is devoted to the analysis of three-dimensional data of atomic force microscopy for research of the morphology of red blood cells. In this paper we built a biomechanical model of the erythrocyte, which allowed calculating the intracellular pressure of erythrocyte based on data of atomic force microscopy. As a result, we obtained the dependence intracellular pressure on the morphology of red blood cell. We have proposed a method of estimating of intracellular pressure of erythrocytes based on numerical modeling and data of atomic force microscopy of erythrocytes scan, which involves a comparison of the experimental data with the results of numerical calculation. The method is applied to the data of atomic force microscopy of erythrocytes of experimental animals - dwarf domestic pigs with different degrees of obstructive jaundice and normal. It is shown that with increasing severity of the disease and the concentration of bilirubin in the blood there is an infringement erythrocyte membranes, by an average increasing their volume and intracellular pressure.Item RF Magnetron Sputtering of Silicon Carbide and Silicon Nitride Films for Solar Cells(Sumy State University, 2014) Zakhvalinskii, V.S.; Piljuk, E.A.; Goncharov, I.Yu.; Rodriges, V.G.; Kuzmenko, A.P.; Taranenko, S.V.; Abakumov, P.A.RF-magnetron nonreactive sputtering method from solid-phase target in argon atmosphere was used for obtaining thin silicon carbide and silicon nitride films, that are used for constructing solar cells based on substrates of single crystal silicon of p-type. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/36380Item Atomic Force Analysis of Elastic Deformations of CD(Сумський державний університет, 2013) Kuzmenko, A.; Kuzko, A.; Timakov, D.; Dobromyslov, M.The procedure for the determination of elastic parameters according to reference nanometer lithographic marks by atomic force microscopy on samples with up to microscopic sizes is proposed. Analysis of dynamic changes of elastic characteristics that makes it possible to establish the critical rotation velocity of a CD without plastic deformations has been made. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33672Item Diode Based on Amorphous SiC(Сумський державний університет, 2013) Zakhvalinskii, V.S.; Borisenko, L.V.; Aleynikov, A.J.; Piljuk, E.A.; Goncharov, I.; Taran, S.V.Diode structure on the basis of amorphous silicon carbide and p-type polycrystalline silicon (Eurosolar) were obtained with magnetron RF-nonreactive sputtering method from solid-phase target in argon atmosphere. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33656Item Features of Structure of Magnetron Films Si3N4 and SiC(Сумський державний університет, 2013) Kuzmenko, A.P.; Chekadanov, A.S.; Zakhvalinsky, S.V.; Pilyuk, E.A.; Dobromyslov, M.B.By small-angle X-ray scattering and atomic force microscopy shows the features of the structure of thin films of Si3N4 and SiC, deposited by magnetron sputtering on glass substrates. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33652Item Frictional Anisotropy of Metal Nanoparticles Adsorbed on Graphene(Сумський державний університет, 2013) Хоменко, Олексій Віталійович; Хоменко, Алексей Витальевич; Khomenko, Oleksii Vitaliiovych; Проданов, Микола Вікторович; Проданов, Николай Викторович; Prodanov, Mykola Viktorovych; Khomenko, M.A.; Krasulya, B.O.На основі методу класичної молекулярної динаміки досліджується сила тертя, що діє на наночастинки срібла і нікелю, які зсуваються на пластинці графену в різних латеральних напрямах. Результати виявляють існування фрикційної анізотропії для обох металів. У більшості випадків максимальне значення сили тертя приблизно у два рази більше ніж мінімальне. Вид залежностей миттєвих значень компонент сили тертя від відповідних латеральних компонент положення центру маси наноострівців сильно залежить від напряму ковзання, змінюючись між пилкоподібним і нерегулярним. Запропоновано якісне пояснення результатів, що ґрунтується на моделі “плям”. При цитуванні документа, використовуйте посилання http://essuir.sumdu.edu.ua/handle/123456789/31950Item Fabrication of Low-Roughness Au/Ti/ SiO2/Si Substrates for Nanopatterning of 16-Mercapto Hexadecanoic Acid (MHA) by Dip-Pen-Nanolithography(Сумський державний університет, 2012) Kumar, A.; Agarwal, P.B.; Gupta, S.K.; Sharma, A.K.; Kumar, D.; Chandra, ShekharSilicon based low-roughness Au/Ti/SiO2/Si substrates were fabricated using standard IC fabrication processes. Evolution of surface roughness during substrate fabrication process was studied. Fabrication process steps, namely, thermal oxidation and e-beam evaporation for ultra-thin Ti(~ 5 nm)/Au(22 nm) films, were optimized to result in surface r.m.s roughness ~ 0.2 m and ~ 1.0 nm, after thermal oxidation and Ti/Au deposition steps respectively. Surface roughness was estimated by atomic force microscope (AFM) imaging and image analysis. Nano-patterning experiments using thiol based 16-MHA molecular-ink on fabricated substrates were carried out, under controlled environment conditions, by dip-pen-nanolithography (DPN) technique. Minimum line-width ~ 60 nm and circular dots radius ~ 175 nm were patterned. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27794